7 results
Changes in Electronic Device Properties During the Formation of Dislocations
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- Journal:
- MRS Online Proceedings Library Archive / Volume 280 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 483
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- 1992
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Strain Relief Mechanisms in The Growth of GexSi1−x/Si(110) Heterostructures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 263 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 403
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- 1992
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Reduced Amorphization of Ion-Milled Silicon Cross-Section Transmission Electron Microscope Samples by Dynamic Annealing During Milling.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 254 / 1991
- Published online by Cambridge University Press:
- 21 February 2011, 249
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- 1991
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The Roles of Stress, Geometry and Orientation on Misfit Dislocations Kinetics and Energetics in Epitaxial Strained Layers.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 239 / 1991
- Published online by Cambridge University Press:
- 22 February 2011, 379
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- 1991
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Experimental Measurement of Transmission Electron Microscope Specimen Temperature during Ion Milling
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- Journal:
- MRS Online Proceedings Library Archive / Volume 199 / 1990
- Published online by Cambridge University Press:
- 16 February 2011, 253
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- 1990
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Techniques of Insulator/Semiconductor Heterostructure Specimen Preparation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 115 / 1987
- Published online by Cambridge University Press:
- 21 February 2011, 63
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- 1987
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Heteronucleation onto Si Surfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 102 / 1987
- Published online by Cambridge University Press:
- 26 February 2011, 455
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- 1987
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